Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Kovarik, L.
Yang, F.
Garg, A.
Diercks, D.
Kaufman, M.
Noebe, R.D.
and
Mills, M.J.
2010.
Structural analysis of a new precipitate phase in high-temperature TiNiPt shape memory alloys.
Acta Materialia,
Vol. 58,
Issue. 14,
p.
4660.
Schreiber, Daniel K.
Choi, Young-suk
Liu, Yuzi
Chiaramonti, Ann N.
Seidman, David N.
and
Petford-Long, Amanda K.
2011.
Effects of elemental distributions on the behavior of MgO-based magnetic tunnel junctions.
Journal of Applied Physics,
Vol. 109,
Issue. 10,
Larson, D.J.
Prosa, T.J.
Geiser, B.P.
and
Egelhoff, W.F.
2011.
Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography.
Ultramicroscopy,
Vol. 111,
Issue. 6,
p.
506.
MARQUIS, E. A.
GEISER, B. P.
PROSA, T. J.
and
LARSON, D. J.
2011.
Evolution of tip shape during field evaporation of complex multilayer structures.
Journal of Microscopy,
Vol. 241,
Issue. 3,
p.
225.
Kelly, Thomas F.
and
Larson, David J.
2012.
Atom Probe Tomography 2012.
Annual Review of Materials Research,
Vol. 42,
Issue. 1,
p.
1.
Gault, Baptiste
Moody, Michael P.
Cairney, Julie M.
and
Ringer, Simon P.
2012.
Atom Probe Microscopy.
Vol. 160,
Issue. ,
p.
71.
Devaraj, Arun
Nag, Soumya
and
Banerjee, Rajarshi
2013.
Alpha phase precipitation from phase-separated beta phase in a model Ti–Mo–Al alloy studied by direct coupling of transmission electron microscopy and atom probe tomography.
Scripta Materialia,
Vol. 69,
Issue. 7,
p.
513.
Miller, M.K.
and
Yao, L.
2013.
Limits of detectability for clusters and solute segregation to grain boundaries.
Current Opinion in Solid State and Materials Science,
Vol. 17,
Issue. 5,
p.
203.
Larson, David J.
Prosa, Ty J.
Ulfig, Robert M.
Geiser, Brian P.
and
Kelly, Thomas F.
2013.
Local Electrode Atom Probe Tomography.
p.
25.
Vurpillot, Francois
Gault, Baptiste
Geiser, Brian P.
and
Larson, D.J.
2013.
Reconstructing atom probe data: A review.
Ultramicroscopy,
Vol. 132,
Issue. ,
p.
19.
Baik, Sung-Il
Yin, Xin
and
Seidman, David N.
2013.
Correlative atom-probe tomography and transmission electron microscope study of a chemical transition in a spinel on an oxidized nickel-based superalloy.
Scripta Materialia,
Vol. 68,
Issue. 11,
p.
909.
Devaraj, A.
Colby, R.
Hess, W. P.
Perea, D. E.
and
Thevuthasan, S.
2013.
Role of Photoexcitation and Field Ionization in the Measurement of Accurate Oxide Stoichiometry by Laser-Assisted Atom Probe Tomography.
The Journal of Physical Chemistry Letters,
Vol. 4,
Issue. 6,
p.
993.
Kirchhofer, Rita
Teague, Melissa C.
and
Gorman, Brian P.
2013.
Thermal effects on mass and spatial resolution during laser pulse atom probe tomography of cerium oxide.
Journal of Nuclear Materials,
Vol. 436,
Issue. 1-3,
p.
23.
Kirchhofer, Rita
Diercks, David R.
Gorman, Brian P.
Ihlefeld, Jon F.
Kotula, Paul G.
Shelton, Christopher T.
Brennecka, Geoff L.
and
Green, D. J.
2014.
Quantifying Compositional Homogeneity in Pb(Zr,Ti)O3 Using Atom Probe Tomography.
Journal of the American Ceramic Society,
Vol. 97,
Issue. 9,
p.
2677.
Diercks, David R.
Musselman, Matthew
Morgenstern, Amanda
Wilson, Timothy
Kumar, Mukesh
Smith, Kandler
Kawase, Makoto
Gorman, Brian P.
Eberhart, Mark
and
Packard, Corinne E.
2014.
Evidence for Anisotropic Mechanical Behavior and Nanoscale Chemical Heterogeneity in Cycled LiCoO2.
Journal of The Electrochemical Society,
Vol. 161,
Issue. 11,
p.
F3039.
Diercks, David R.
Gorman, Brian P.
Manerbino, Anthony
Coors, Grover
and
Salvador, P.
2014.
Atom Probe Tomography of Yttrium‐Doped Barium–Cerium–Zirconium Oxide with NiO Addition.
Journal of the American Ceramic Society,
Vol. 97,
Issue. 10,
p.
3301.
Diercks, David R.
Li, Jiaojiao
Beach, Joseph D.
Wolden, Colin A.
and
Gorman, Brian P.
2014.
Atom probe tomography for nanoscale characterization of CdTe device absorber layers and interfaces.
p.
0085.
Miller, Michael K.
and
Forbes, Richard G.
2014.
Atom-Probe Tomography.
p.
189.
Herbig, M.
Choi, P.
and
Raabe, D.
2015.
Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography.
Ultramicroscopy,
Vol. 153,
Issue. ,
p.
32.
Jeon, Nari
and
Lauhon, Lincoln J.
2015.
Semiconductor Nanowires I - Growth and Theory.
Vol. 93,
Issue. ,
p.
249.