Although it has been possible for many years to determine the average position of atoms by using diffraction techniques, finding the positions of specific atoms has been an elusive target. This latter goal is now in sight. Individual atoms on surfaces were first seen in the seventies by the Chicago Group using the then newly invented Scanning Transmission Electron Microscope (STEM). More recently atoms on surfaces have also been seen by Scanning Tunneling Microscopy (STM) and associated variants (e.g. Atomic Force Microscopy). Atomic structures in the interior of a material have been imaged in recent years through atomic resolution transmission electron microscopy of thin film specimens. Progress in these developments is following an acceleration path and the Materials Research Division of the NSF recently commissioned a panel to review the area and provide advice on an appropriate response.