Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

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Teaching Microscopy and Microanalysis

Research Article

The Electron Microscopy Database: Example Data Sets for Teaching and Learning Quantitative TEM
PM Voyles
Published online by Cambridge University Press:

03 August 2008, pp. 82-83
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Instruction and Training at the University of Georgia EM Lab
JP Shields
Published online by Cambridge University Press:

03 August 2008, pp. 84-85
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electronic Training Resource for Higher Education
K Schierbeek, SE Hill, OP Mills
Published online by Cambridge University Press:

03 August 2008, pp. 86-87
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Quantitative analyses of early stages of phase transformation by atom probe tomography
EA Marquis
Published online by Cambridge University Press:

03 August 2008, pp. 88-89
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Ionization of inner shells of atoms by electron impact
F Salvat, D Bote, C Merlet, X Llovet
Published online by Cambridge University Press:

03 August 2008, pp. 90-91
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy
PD Nellist, EC Cosgriff, PB Hirsch, DJ Cockayne
Published online by Cambridge University Press:

03 August 2008, pp. 92-93
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Scanning Probe Microscopy in the Physical and Biological Sciences

Research Article

Applications of Scanned Probe Microscopy in Physical Sciences
PE Russell, D Leonard, J Thorton
Published online by Cambridge University Press:

03 August 2008, pp. 94-95
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Towards multi-scale 3D biological imaging: The role of dual-beam serial sectioning
CJ Gilpin
Published online by Cambridge University Press:

03 August 2008, pp. 96-97
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Detecting nanoparticles in cells using FIB-EDS
K Scott, RD Holbrook
Published online by Cambridge University Press:

03 August 2008, pp. 98-99
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-situ Mechanical Testing of Micro-Sized Specimens Fabricated by FIB
R Wheeler, P Shade, M Uchic, D Dimiduk, A Shiveley, D Sergison, HL Fraser
Published online by Cambridge University Press:

03 August 2008, pp. 100-101
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Problem Solving with Light Microscopy

Research Article

Using Light Microscopy in the Analysis of Textile Materials
ML Sullivan
Published online by Cambridge University Press:

03 August 2008, pp. 102-103
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in Electron Tomography for the Physical and Biological Sciences

Research Article

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
PD Nellist, EC Cosgriff, G Behan, AI Kirkland, AJ D'Alfonso, SD Findlay, LJ Allen
Published online by Cambridge University Press:

03 August 2008, pp. 104-105
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Supermontaging: Reconstructing Large Cellular Volumes by Stitching Together Laterally Adjacent Tomograms
DN Mastronarde, PA van der Heide, GP Morgan, BJ Marsh
Published online by Cambridge University Press:

03 August 2008, pp. 106-107
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Problem Solving Using Microanalytical Techniques

Research Article

Specimen Heterogeneity Analysis Revisited
F Meisenkothen, JJ Donovan
Published online by Cambridge University Press:

03 August 2008, pp. 108-109
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Determining Bulk Chemical Compositions of Chondrules by Electron Microprobe: Modal Recombination versus Defocused Beam Analyses
J Berlin, RH Jones, AJ Brearley, MN Spilde
Published online by Cambridge University Press:

03 August 2008, pp. 110-111
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Trace-element Analyses in Lunar Meteorite Sayh al Uhaymir 169
RA Zeigler, PK Carpenter, BL Jolliff, RL Korotev
Published online by Cambridge University Press:

03 August 2008, pp. 112-113
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

Impact of 40 Years of Technology Advances on EDS System Performance
JJ McCarthy, JJ Friel, P Camus, D Rohde
Published online by Cambridge University Press:

03 August 2008, pp. 114-115
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Results from Two Four-Channel Si-drift Detectors on an SEM: Conventional and Annular Geometries
PG Kotula, JR Michael, M Rohde
Published online by Cambridge University Press:

03 August 2008, pp. 116-117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

Scanning Electron and Ion Microscope-based Size and Shape Metrology at the Nanometer Scale
AE Vladár, P Cizmar, MT Postek
Published online by Cambridge University Press:

03 August 2008, pp. 118-119
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Backscattered Electron Imaging in the Scanning Electron Microscope: the Use of Either: (a) High Incident Energy or (b) an Array Detector
LM Gignac, OC Wells, C-K Hu, J Bruley, CE Murray, A Frye
Published online by Cambridge University Press:

03 August 2008, pp. 120-121
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Teaching Microscopy and Microanalysis

Research Article

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Scanning Probe Microscopy in the Physical and Biological Sciences

Research Article

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Problem Solving with Light Microscopy

Research Article

Advances in Electron Tomography for the Physical and Biological Sciences

Research Article

Problem Solving Using Microanalytical Techniques

Research Article

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

21st Century Scanning Microscopy - Electrons and He Ions

Research Article