Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999
Environmental Scanning Electron Microscopy and Other Wet Work
Secondary Electron Yield Curve for Liquid Water
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- 02 July 2020, pp. 282-283
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3D Reconstructions Using Charge Contrast Imaging
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- 02 July 2020, pp. 284-285
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Environmental SEM in a Multi-User Biological Sciences E.M. Unit
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- 02 July 2020, pp. 286-287
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ESEM Imaging of P-N Junctions Using a Gaseous Secondary Electron Detector
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- 02 July 2020, pp. 288-289
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What Do We Need to Look Out for When Doing Energy Dispersive Xray Analysis in the Environmental Scanning Electron Microscope?
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- 02 July 2020, pp. 290-291
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Evaluation of the Variable Pressure Correction Technique for X-ray Microanalysis in the ESEM
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- 02 July 2020, pp. 292-293
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A Novel Technique for Probe Intensity Profile Characterisation in the Environmental Scanning Electron Microscope
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- 02 July 2020, pp. 294-295
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The Computation of the Skirt in VP-SEM OR ESEM With Monte Carlo Simulations
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- 02 July 2020, pp. 296-297
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Accuracy of Spatial Measurements at Elevated Temperatures in an Environmental Scanning Electron Microscope
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- 02 July 2020, pp. 298-299
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Environmental SEM Study of Sodium Alginate Beads
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- 02 July 2020, pp. 300-301
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Low Voltage (1-5 kv) X-ray Microanalysis
Physical Considerations in Low Energy Biological Analysis
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- 02 July 2020, pp. 302-303
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Microcalorimeter Energy Dispersive Spectrometry for Low Voltage SEM
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- 02 July 2020, pp. 304-305
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Low Voltage Microanalysis and Imaging: Opportunities and Limitations of High-Resolution Analysis in Fe-SEM Instruments
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- 02 July 2020, pp. 306-307
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On the Microanalysis of Small Precipitates at Low Voltage with a FE-SEM
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- 02 July 2020, pp. 308-309
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High Spatial Resolution Low Energy Electron Beam X-ray Microanalysis
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- 02 July 2020, pp. 310-311
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Low Voltage ED-X-ray Microanalysis of Bulk Organic Materials
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- 02 July 2020, pp. 312-313
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LVEDS For Advanced Materials and Semiconductor Technologies
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- 02 July 2020, pp. 314-315
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On the Contrast of Precipitates Observed with a FE-SEM
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- 02 July 2020, pp. 316-317
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Quantitative Chemical Mapping with Low-Voltage EDS Spectrum Imaging and Multivariate Statistical Analysis (MSA)
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- 02 July 2020, pp. 318-319
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Scanning Electron Microscopy
NETSEM Collaborator - an Application in Telemicroscopy
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- 02 July 2020, pp. 320-321
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