Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract

Atomic-Resolution Monitoring of Structural Phase Transition in Bi-magnetic Core/Shell Oxide Nanoparticles

Ex-situ and In-situ Analysis of MoVTeNb Oxide by Aberration-Corrected Scanning Transmission Electron Microscopy

Novel M1/M2 Heterostructure in Mo-V-M-Ta (M = Te or Sb) Complex Oxide Catalyst Revealed by Aberration Corrected HAADF STEM

Evaluation of Sensitivity of Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets and its Improvement

Zone Axis STEM Defect Imaging Based on Electron Kossel Patterns

Characterizing Sub-lattice Occupancies in B2 Phases in High Entropy Metallic Alloys using Atomic Resolution STEM-XEDS Mapping

Application of the Projective Standard Deviation to STEM Imaging and Analysis

Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes

Dynamics of Electron Beam Channeling in Single Atomic Column and in Crystals

Resolving 45 pm with 300 kV Aberration Corrected STEM

Getting the Best from an Imperfect Detector - an Alternative Normalisation Procedure for Quantitative HAADF STEM

Simultaneous High-Speed DualEELS and EDS Acquisition at Atomic Level

Improving the Spatial Resolution of Atomic-Scale EDS Mapping for Chemical Imaging and Quantification of Metallic Alloy Structures

Anti-Site Defects in Perovskite YAlO3:Ce Using Aberration-Corrected STEM

Removal of FEG Fluctuations in STEM Imaging

Interfacial Atomic Number Contrast in Thick Samples

Study of the Ultrathin Ferroelectric BaTiO3 Film using Scanning Transmission Electron Microscopy

Putting a New Spin on Scanning Transmission Electron Microscopy

Sample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies

Analytical ETL/EML Layer Investigation of Blue OLEDs

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract