Biological Applications
Identifying Dynamic Membrane Structures with Atomic-Force Microscopy and Confocal Imaging
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- 13 February 2014, pp. 514-520
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Electron and Force Microscopy Characterization of Particle Size Effects and Surface Phenomena Associated with Individual Natural Organic Matter Fractions
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- 26 February 2014, pp. 521-530
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Synchrotron-Based Chemical Nano-Tomography of Microbial Cell-Mineral Aggregates in their Natural, Hydrated State
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- 19 February 2014, pp. 531-536
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Nanoscale Focused Ion Beam Tomography of Single Bacterial Cells for Assessment of Antibiotic Effects
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- 04 March 2014, pp. 537-547
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Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series
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- 19 February 2014, pp. 548-560
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Utilization of Optical Polarization Microscopy in the Study of Sorption Characteristics of Wound Dressing Host Materials
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- 24 February 2014, pp. 561-565
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Multi-Scale Visualization of Dynamic Changes in Poplar Cell Walls During Alkali Pretreatment
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- 19 February 2014, pp. 566-576
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Materials Applications
Simultaneous Hydrogen and Heavier Element Isotopic Ratio Images with a Scanning Submicron Ion Probe and Mass Resolved Polyatomic Ions
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- 19 February 2014, pp. 577-581
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Application of Dynamic Impedance Spectroscopy to Scanning Probe Microscopy
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- 13 February 2014, pp. 582-585
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Surface Charge and Carbon Contamination on an Electron-Beam-Irradiated Hydroxyapatite Thin Film Investigated by Photoluminescence and Phase Imaging in Atomic Force Microscopy
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- 09 April 2014, pp. 586-595
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Characterization of Fibrous Mimetite
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- 19 February 2014, pp. 596-601
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Performance of High-Resolution SEM/EDX Systems Equipped with Transmission Mode (TSEM) for Imaging and Measurement of Size and Size Distribution of Spherical Nanoparticles
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- 19 February 2014, pp. 602-612
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Aberration-Corrected X-Ray Spectrum Imaging and Fresnel Contrast to Differentiate Nanoclusters and Cavities in Helium-Irradiated Alloy 14YWT
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- 06 March 2014, pp. 613-626
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The Importance of Averaging to Interpret Electron Correlographs of Disordered Materials
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- 19 February 2014, pp. 627-634
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Sectioning of Individual Hematite Pseudocubes with Focused Ion Beam Enables Quantitative Structural Characterization at Nanometer Length Scales
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- 19 February 2014, pp. 635-644
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Book Review
Helium Ion Microscopy, Principles and Applications, David C. Joy. Springer, New York, 2013, 64 pages. ISBN 978-1-4614-8659-6.
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- 24 February 2014, p. 645
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Front Cover (OFC, IFC) and matter
MAM volume 20 issue 2 Cover and Front matter
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- 23 April 2014, pp. f1-f18
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Back Cover (OBC, IBC) and matter
MAM volume 20 issue 2 Cover and Back matter
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- 23 April 2014, pp. b1-b7
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