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X-ray Microanalysis at High Count Rate with Latest Generation Silicon Drift Energy Dispersive Spectrometer

Published online by Cambridge University Press:  01 August 2018

Philippe T. Pinard ,
Simon Burgess ,
John Qing Zhang ,
James Holland  and
Peter Statham
Philippe T. Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
John Qing Zhang
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
James Holland
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Peter Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 724 - 725
Copyright
© Microscopy Society of America 2018 

References

[1] Newbury, D Ritchie, NWM Microsc. Microanal. 22 2016) p. 520.Google Scholar
[2] Burgess, S, et al, Microsc. Microanal. 23(S1 2017) p. 46.Google Scholar
[3] Wuhrer, R Moran, K IOP Conf. Ser.: Mater. Sci. Eng. 55 (2014), 012021.Google Scholar