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X-ray Emission From Thin Films on a Substrate - Experiments and Simulation

Published online by Cambridge University Press:  25 July 2016

Yu Yuan ,
Hendrix Demers ,
Nicolas Brodusch  and
Raynald Gauvin
Yu Yuan
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 400 - 401
Copyright
© Microscopy Society of America 2016 

References

[1] Armigliato, A. & Rosa, R. Ultramicroscopy 32 (1990). p. 127–136.Google Scholar
[2] Hovington, P., Drouin, D. & Gauvin, R. Scanning 19 (1997). p. 1–14.Google Scholar
[3] Drouin, D., Couture, A. R. & Gauvin, R. Scanning 29 (2007). p. 92–101.CrossRefGoogle ScholarPubMed
[4] Reed, S.J.B. in Electron microprobe analysis (ed. D Writers, (University Press, Cambridge)) p. 242–261.Google Scholar