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XPS and SEM/STEM Characterization of Silver Nanoparticles Formed from the X-ray-Induced and Thermal Reduction of Silver Behenate

Published online by Cambridge University Press:  26 July 2009

BR Strohmeier ,
KL Bunker ,
CL Lopano ,
JP Marquis ,
JD Piasecki ,
KE Bennethum ,
RG White ,
T Nunney  and
RJ Lee
BR Strohmeier
Affiliation:
RJ Lee Group,Inc
KL Bunker
Affiliation:
RJ Lee Group,Inc
CL Lopano
Affiliation:
RJ Lee Group,Inc
JP Marquis
Affiliation:
RJ Lee Group,Inc
JD Piasecki
Affiliation:
RJ Lee Group,Inc
KE Bennethum
Affiliation:
RJ Lee Group,Inc
RG White
Affiliation:
Thermo Fisher Scientific
T Nunney
Affiliation:
Thermo Fisher Scientific
RJ Lee
Affiliation:
RJ Lee Group,Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1298 - 1299
Copyright
Copyright © Microscopy Society of America 2009