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When will low-contrast features be visible in a STEM X-ray spectrum image?
Published online by Cambridge University Press: 23 September 2015
Abstract
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- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1425 - 1426
- Copyright
- Copyright © Microscopy Society of America 2015
References
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Talukder, M R et a., Int. J. Mass Spect. V269 (2008). P 118–130. V309 (2012) P. 118.Google Scholar
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Williams, DB & Carter, CB," Transmission Electron Microscopy, (2 ed)," Springer, Belin (2009).Google Scholar
[8] This work was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. A portion of the Microscopy conducted as part of a user proposal at ORNL's Center for Nanophase Materials Sciences, which is an Office of Science User Facility. I acknowledge the use of the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation.Google Scholar