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Wet STEM - A New SEM Method Revealing High Resolution Transmitted Information from Hydrated Samples

Published online by Cambridge University Press:  31 July 2006

I Gestmann ,
D Bultreijs ,
E Baken  and
B Lich
I Gestmann
Affiliation:
FEI Company
D Bultreijs
Affiliation:
FEI Company
E Baken
Affiliation:
FEI Company
B Lich
Affiliation:
FEI Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1486 - 1487
Copyright
© 2006 Microscopy Society of America