Hostname: page-component-848d4c4894-p2v8j Total loading time: 0 Render date: 2024-05-07T22:36:52.656Z Has data issue: false hasContentIssue false
  • English
  • Français

Way to Reduce Electron Dose in Pseudo Atomic Column Elemental Maps by 2D STEM Moire Method

Published online by Cambridge University Press:  04 August 2017

Yukihito Kondo ,
Kei-ichi Fukunaga ,
Eiji Okunishi  and
Noriaki Endo
Yukihito Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.
Kei-ichi Fukunaga
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.
Eiji Okunishi
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.
Noriaki Endo
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1790 - 1791
Copyright
© Microscopy Society of America 2017 

References

[1] Okunishi, E, et al, Microsc. Microanal. 12(S2 2006). p. 1150.Google Scholar
[2] Kawai, S, et al, Microsc. Microanl 20(S3 2014). p. 1150.CrossRefGoogle Scholar
[3] Kondo, Y & Okunishi, E Microscopy 63(5 2014). p. 391.Google Scholar
[4] Okunishi, E & Kondo, Y Microsc. Microanl 22(S3 2016). p. 264.Google Scholar
[5] Okunishi, E & Kondo, Y European Microscopy Congress 2016: Proceedings 2016). p. 555.Google Scholar
[6] Kondo, Y, et al, European Microscopy Congress 2016: Proceedings 2016). p. 542.Google Scholar