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VSEM : An Interactive Simulation and Virtual Reality Model of the Scanning Electron Microscope

Published online by Cambridge University Press:  02 July 2020

DM Holburn
Affiliation:
Department of Engineering, Cambridge University, Trumpington Street, Cambridge, CB2 1PZ, UK
BC Breton
Affiliation:
Department of Engineering, Cambridge University, Trumpington Street, Cambridge, CB2 1PZ, UK
RP Robertson
Affiliation:
Department of Engineering, Cambridge University, Trumpington Street, Cambridge, CB2 1PZ, UK
JS Thompson
Affiliation:
Department of Engineering, Cambridge University, Trumpington Street, Cambridge, CB2 1PZ, UK
NHM Caldwell
Affiliation:
Department of Engineering, Cambridge University, Trumpington Street, Cambridge, CB2 1PZ, UK
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Extract

The capabilities of the scanning electron microscope (SEM continue to grow. An understanding of and competency in operating the SEM is a vital asset to researchers in many fields. Acquiring the practical knowledge demands considerable training, which is expensive in terms of instrument time and personnel resources. Moreover confined laboratory environments severely limit the number of operators who can be trained simultaneously.

An alternative training approach is to develop software simulations. For example, the Interactive Microscope Laboratory simulates the optical microscope as part of a computer-based teaching resource for school-level biology courses. The VSEM (Virtual Scanning Electron Microscope) project extends our earlier work on emulating the operation and behaviour of the SEM and combines it with a virtual reality model of the instrument. The aim of the VSEM project has been to develop a microscopy teaching application which can be deployed on multiple platforms without the need for expensive hardware or software support facilities.

Type
Teaching Microscopy in the New Millennium
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Baggott, L. and Watson, K. “Interactive Microscope Laboratory Project: An Innovative Virtual Microscope for Teaching and Learning”, Microscopy and Analysis, 61, 2729, 1997.Google Scholar
2.Holburn, DM et al. “A Virtual Scanning Electron Microscope for Teaching and Training”, Microscopy and Analysis, in press.Google Scholar
3.Breton, BC and Caldwell, NHM would like to acknowledge the financial support of LEO Electron Microscopy Ltd. and the Isaac Newton Trust.Google Scholar