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Visualizing Redox Chemistry in Oxide Surfaces at Atomic-Resolution

Published online by Cambridge University Press:  04 August 2017

M. Ek ,
Q.M. Ramasse ,
L. Arnarson ,
P.G. Moses ,
C.F. Kisielowski ,
J.R. Jinschek  and
S. Helveg
M. Ek
Affiliation:
Haldor Topsoe A/S, Haldor Tops0es Alle 1, DK-2800 Kgs. Lyngby, Denmark.
Q.M. Ramasse
Affiliation:
SuperSTEM Laboratory, STFC Daresbury, Keckwick Lane, Daresbury WA4 4AD, United Kingdom.
L. Arnarson
Affiliation:
Haldor Topsoe A/S, Haldor Tops0es Alle 1, DK-2800 Kgs. Lyngby, Denmark.
P.G. Moses
Affiliation:
Haldor Topsoe A/S, Haldor Tops0es Alle 1, DK-2800 Kgs. Lyngby, Denmark.
C.F. Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory, The Molecular Foundry, One Cyclotron Road, Berkeley California 94720, USA.
J.R. Jinschek
Affiliation:
The Ohio State University, Department of Materials Science and Engineering & Center for Electron Microscopy and Analysis (CEMAS), 1305 Kinnear Road, Columbus, Ohio 43212, USA.
S. Helveg
Affiliation:
Haldor Topsoe A/S, Haldor Tops0es Alle 1, DK-2800 Kgs. Lyngby, Denmark.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 904 - 905
Copyright
© Microscopy Society of America 2017 

References

[1] Helveg, S. J. Catal 328 2015). p. 102.CrossRefGoogle Scholar
[2] Jinschek, J.R. & Helveg, S. Micron 43 2012). p. 1156.CrossRefGoogle Scholar
[3] Helveg, S., Kisielowski, C.F., Jinschek, J.R., Specht, P., Yan, G. & Frei, H. Micron 68 2014). p. 176.CrossRefGoogle Scholar
[4] Ek, M., Jespersen, S.P.F., Damsgaard, C.D. & Helveg, S. Adv. Struct. Chem. Imag 2016). p. 2 4.Google Scholar
[5] Kisielowski, C., Frei, H., Specht, P., Sharp, I.D., Haber, J.A. & Helveg, S. Adv. Struct. Chem. Imag 2016). p. 2:13.Google Scholar
[6] Ek, M., Ramasse, Q.M., Arnarson, L., Moses, P.G. & Helveg, S. under review (2017).Google Scholar