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Visualization of Misfit Dislocation Network at the BaSnO3-LaAlO3 Interface

Published online by Cambridge University Press:  05 August 2019

Hwanhui Yun ,
Abhinav Prakash ,
Bharat Jalan ,
Jong Seok Jeong  and
K. Andre Mkhoyan
Hwanhui Yun*
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USA.
Abhinav Prakash
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USA.
Bharat Jalan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USA.
Jong Seok Jeong
Affiliation:
Analytical Sciences Center, LG Chem Ltd., Daejeon, Republic of Korea.
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USA.
*
*Corresponding author: yunxx133@umn.edu

Abstract

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Type
Current and Emerging Microscopy for Quantum Information Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 980 - 981
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Hwang, HY et al. , Nat. Mater. 11 (2012), p. 103.Google Scholar
[2]Nakagawa, N, Hwang, H.Y., Muller, D.A., Nat. Mater. 5 (2006), p. 204.Google Scholar
[3]Yun, H et al. , Sci. Rep. 8 (2018), p. 10245.Google Scholar
[4]Wu, RJ et al. , Microsc. Microanal. 23 (2017), p. 794.Google Scholar
[5]Prakash, A et al. , JVSTA 33 (2015), p. 060608.Google Scholar
[6]Kirkland, AJ in “Advanced Computing in Electron Microscopy” (Springer, New York).Google Scholar
[7]This work was supported by the UMN MRSEC program (No. DMR-1420013) and a fellowship from the Samsung scholarship foundation, Republic of Korea.Google Scholar