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Viability of Compressed Sensing as a Dose Reduction Strategy in STEM

Published online by Cambridge University Press:  05 August 2019

W. Van den Broek ,
B.W. Reed ,
A. Béché ,
J. Verbeeck  and
C.T. Koch
W. Van den Broek*
Affiliation:
Institut für Physik & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany
B.W. Reed
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton CA, US
A. Béché
Affiliation:
EMAT, Antwerp University, Antwerp, Belgium
J. Verbeeck
Affiliation:
EMAT, Antwerp University, Antwerp, Belgium
C.T. Koch
Affiliation:
Institut für Physik & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany
*
*Corresponding author: vandenbroek@physik.hu-berlin.de

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1686 - 1687
Copyright
Copyright © Microscopy Society of America 2019 

References

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[2]Shi, D., et al. , eLife 2 (2013), p. e01345.Google Scholar
[3]Romberg, J., IEEE Signal Processing Magazine 25 (2008), p. 14.Google Scholar
[4]Papafitsoros, K. and Schönlieb, C.B., Journal of Mathematical Imaging and Vision 48 (2014), p. 308.Google Scholar
[5]Van den Broek, W., et al. , IEEE Transactions on Computational Imaging, DOI: 10.1109/TCI.2019.2894950Google Scholar
[6]Acknowledgements. WVdB: DFG project BR 5095/2-1. Hercules fund from the Flemish Government for the Qu-Ant-EM microscope. AB, JV: FWO project G093417N. CTK: DFG project CRC 951. Prof. L. Liz-Marzan for the TEM sample.Google Scholar