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Versatile and Inexpensive Specimen Holder for High Angle Azimuth Rotation in a Low Temperature Scanning Electron Microscope

Published online by Cambridge University Press:  02 July 2020

William P. Wergin ,
Eric F. Erbe  and
Ronald Ochoa
William P. Wergin
Affiliation:
Nematology Laboratory, Agricultural Research Service, U.S. Department of Agriculture, Beltsville, MD, 20705, USA
Eric F. Erbe
Affiliation:
Nematology Laboratory, Agricultural Research Service, U.S. Department of Agriculture, Beltsville, MD, 20705, USA
Ronald Ochoa
Affiliation:
Systematic Entomology Laboratory, Agricultural Research Service, U.S. Department of Agriculture, Beltsville, MD, 20705, USA
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Abstract

Low temperature scanning electron microscopy (LTSEM) avoids many of the artifacts associated with chemical fixation, dehydration and critical point drying. As a result, this technique has had numerous applications ranging from biology to hydrology. Unfortunately, experiments using LTSEM are frequently compromised by the limited sample manipulations that are available on most cryo-stages and by the cost of specimen holders. Whereas the conventional SEM stage enables 360° rotation and tilts as great as 90°, the braids or hoses required for cooling a cryo-stage generally limit rotation to about 30° and tilt to less than 40° from normal. Furthermore, the specimen holders for LTSEM may cost several hundred dollars each, thereby prohibiting experiments that require numerous holders. This study describes an inexpensive specimen holder that solves these problems.

Figure la illustrates a drawing of the specimen holder supplied with the standard transfer device from the Oxford CT 1500 Cryotrans System.

Type
Cryoimmobilization, Freeze Substitution and Cryoem (Organized by S. Erlandsen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 718 - 719
Copyright
Copyright © Microscopy Society of America 2001

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References

1. Wergin, et al., Focus on Multidimensional Microscopy, New Jersey, World Scientific 1(1999)262CrossRefGoogle Scholar

2. Wergin, et al., J. Microsc. Soc. Amer. 2(1996)99.Google Scholar