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Microscopy and Microanalysis Microscopy and Microanalysis

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Using Ma ss Resolving Power as a Performance Metric in the Atom Probe

Published online by Cambridge University Press:  25 July 2016

Fred Meisenkothen ,
Thomas F. Kelly ,
Edward Oltman ,
Joseph H. Bunton ,
Ludovic Renaud  and
David J. Larson
Fred Meisenkothen
Affiliation:
National Institute for Standards and Technology, Gaithersburg, MDU.S.A
Thomas F. Kelly
Affiliation:
CAMECA Instruments, Inc., Madison, WIU.S.A
Edward Oltman
Affiliation:
CAMECA Instruments, Inc., Madison, WIU.S.A
Joseph H. Bunton
Affiliation:
CAMECA Instruments, Inc., Madison, WIU.S.A
Ludovic Renaud
Affiliation:
CAMECA SA, Gennevilliers, France
David J. Larson
Affiliation:
CAMECA Instruments, Inc., Madison, WIU.S.A
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Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 680 - 681
Copyright
© Microscopy Society of America 2016 

References

[1] Clifton, P.H., et al., Microscopy and Microanalysis 14 (2008). p. 454.CrossRefGoogle Scholar
[2] Currie, L. Analytical Chemistry 40 (1968). p. 586.CrossRefGoogle Scholar
[3] The authors would like to thank Dr. Eric Steel of NIST and Mr. Robert Ulfig, Dr. Ty J. Prosa, and Dr. Hugues Francois Saint Cyr of CAMECA for helpful discussions and encouragement during the course of this work.Google Scholar
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