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Use of HfC(310) as a High Brightness Electron Sources for Advanced Imaging Applications

Published online by Cambridge University Press:  27 August 2014

J.M. Lovell ,
W.A. Mackie ,
T.W. Curtis  and
G.G. Magera
J.M. Lovell
Affiliation:
Applied Physics Technologies, Inc. 1600 NE Miller St., McMinnville, OR, 97128, USA
W.A. Mackie
Affiliation:
Applied Physics Technologies, Inc. 1600 NE Miller St., McMinnville, OR, 97128, USA Linfield Research Institute, 900 SE Baker St., McMinnville, OR 97128, USA
T.W. Curtis
Affiliation:
Applied Physics Technologies, Inc. 1600 NE Miller St., McMinnville, OR, 97128, USA
G.G. Magera
Affiliation:
Applied Physics Technologies, Inc. 1600 NE Miller St., McMinnville, OR, 97128, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 48 - 49
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Mackie, W.A.and Davis, P.R. IEEE Trans. Electron Devices, 36, 220 (1989).Google Scholar
[2] Swanson, L.W. and Schwind, G.A. in Handbook of Charged Particle Optics, edited by J. Orloff (CRC, Boca Raton, FL 1997), Chap. 2, pp. 77-102.Google Scholar
[3] www.a-p-tech.com.Google Scholar
[4] The authors acknowledge that financial support was provided in part by Air Force Research Laboratory (AFRL). Joe Hancock is thanked for electronic and vacuum system support.Google Scholar