Hostname: page-component-77c89778f8-rkxrd Total loading time: 0 Render date: 2024-07-19T23:42:19.418Z Has data issue: false hasContentIssue false
  • English
  • Français

Use of FIB to Identify Opens in Metal - Metal Bonds

Published online by Cambridge University Press:  27 August 2014

Nathan Wang ,
Jason Silva  and
George Perreault
Nathan Wang
Affiliation:
Maxim Integrated, San Jose CA, USA
Jason Silva
Affiliation:
Maxim Integrated, San Jose CA, USA
George Perreault
Affiliation:
Maxim Integrated, San Jose CA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1878 - 1879
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Reyntjens, S., Micromech., J. Microeng. 11 (2001) p. 287.Google Scholar
[2] Olden, E.C. Symp. Methods of Metallographic Specimen Preparation, ASTM (1960), p. 16.Google Scholar
[3] Ohya, K. “Imaging Using Electrons and Ion Beams”, Focused Ion Beam Systems, ed. N. Yao,Cambridge (2007), p. 108.Google Scholar