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The Use of Analytical Electron Microscopy for the Complete Characterization of IC Customer Returns

Published online by Cambridge University Press:  05 August 2007

B Tracy ,
S Li ,
A Myers ,
A delRosario  and
M Sidorov
B Tracy
Affiliation:
Spansion Inc
S Li
Affiliation:
Spansion Inc
A Myers
Affiliation:
Spansion Inc
A delRosario
Affiliation:
Spansion Inc
M Sidorov
Affiliation:
Spansion Inc
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1132 - 1133
Copyright
© 2007 Microscopy Society of America

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