Hostname: page-component-848d4c4894-mwx4w Total loading time: 0 Render date: 2024-06-24T10:38:16.238Z Has data issue: false hasContentIssue false

Universal Mean Atomic Number curves for EPMA calculated by Monte Carlo simulations

Published online by Cambridge University Press:  30 July 2021

Aurélien Moy
Affiliation:
Department of Geoscience, University of Wisconsin-Madison, United States
Anette von der Handt
Affiliation:
Department of Earth and Environmental Sciences, University of Minnesota, Minneapolis, Minnesota, United States
John Fournelle
Affiliation:
Department of Geoscience, University of Wisconsin-Madison, United States
William Nachlas
Affiliation:
Department of Geoscience, University of Wisconsin-Madison, United States
John Donovan
Affiliation:
CAMCOR, University of Oregon, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Merlet, C. and Bodinier, J-L. (1990) Electron microprobe determination of minor and trace transition elements in silicate minerals: A method and its application to mineral zoning in the peridotite nodule PHN 1611. Chemical Geology, 83:5569CrossRefGoogle Scholar
Donovan, J.J. and Tingle, T.N. (1996) An improved mean atomic number background correction for quantitative microanalysis. Microscopy and Microanalysis, 2:17.Google Scholar
Donovan, J.J., Singer, J.W., and Armstrong, J.T. (2016) A new EPMA method for fast trace element analysis in simple matrices. American Mineralogist, 101:1839–53.CrossRefGoogle Scholar
Barkman, J.E., Carpenter, P., Zhao, J-C., and Donovan, J.J. (2013) Electron microprobe quantitative mapping vs defocused beam analysis. Microscopy and Microanalysis, 848–9.CrossRefGoogle Scholar
Llovet, X., and Salvat, F. (2016) PENEPMA: A Monte Carlo programme for the simulation of X-ray emission in EPMA. IOP Conference Series: Materials Science and Engineering, 109.Google Scholar
Small, J.A., Leigh, S.D., Newbury, D.E., and Myklebust, R.L. (1987) Modeling of the bremsstrahlung radiation produced in pure-element targets by 10-40 keV electrons. Journal of Applied Physics, 61, 459469.CrossRefGoogle Scholar
Donovan, J.J., and Pingitore, N.E. (2002) Compositional averaging of continuum intensities in multielement compounds. Microscopy and Microanalysis, 8, 429436.CrossRefGoogle ScholarPubMed
Donovan, J.J., Pingitore, N.E. and Westphal, A. (2003) Compositional averaging of backscatter intensities in compounds. Microscopy and Microanalysis, 9, 202215.Google ScholarPubMed
Donovan, J.J., Fellowes, J., and McMorran, B. (2019) Average Atomic Number and Electron Backscattering in Compounds. Microscopy and Microanalysis, 25, 23142315.Google Scholar
Support for this research came from the National Science Foundation: EAR-1337156 (JHF), EAR-1554269 (JHF), EAR-1849386 (JHF) and EAR-1849465 (AVDH).Google Scholar