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Unique Line Defect Discovered in BaSnO3 Thin Film

Published online by Cambridge University Press:  01 August 2018

Hwanhui Yun ,
Jong Seok Jeong  and
K. Andre Mkhoyan
Hwanhui Yun
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN
Jong Seok Jeong
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 68 - 69
Copyright
© Microscopy Society of America 2018 

References

[1] Jeong, J. S., et al, ACS Nano 7 2013) p. 4487.Google Scholar
[2] MacLaren, I., et al, Adv. Funct. Mat 23 2013) p. 683.Google Scholar
[3] Jeong, J. S., et al, Nano Lett. 16 2016) p. 6816.Google Scholar
[4] Ganguly, K., et al, APL Mater. 3 2015) p. 062509.Google Scholar
[5] Wang, W. Y., et al, Sci. Rep. 5 2015) p. 16097.Google Scholar
[6] We thank K. Ganguly, W. Postiglione, B. Jalan, and C. Leighton for BaSnO3 films. This work was supported partially by the NSF MRSEC under Award Number DMR-1420013, Grant-in-Aid program of the University of Minnesota, and a fellowship from the Samsung Scholarship Foundation, Republic of Korea.Google Scholar