Hostname: page-component-77c89778f8-7drxs Total loading time: 0 Render date: 2024-07-19T20:55:22.021Z Has data issue: false hasContentIssue false
  • English
  • Français

Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations

Published online by Cambridge University Press:  05 August 2019

Ruopeng Zhang ,
Shiteng Zhao ,
Thomas Pekin ,
Eric Rothchild ,
Mark Asta ,
Daryl. C. Chrzan  and
Andrew M. Minor
Ruopeng Zhang
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley 94720, USA
Shiteng Zhao
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley 94720, USA
Thomas Pekin
Affiliation:
Department of Physics, Humboldt-Universität zu Berlin, Newtonstraße 15, 12489 Berlin, Germany.
Eric Rothchild
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA
Mark Asta
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley 94720, USA
Daryl. C. Chrzan
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley 94720, USA
Andrew M. Minor*
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley 94720, USA
*
*Corresponding author: aminor@berkeley.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1892 - 1893
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Blackburn, M.J. and Williams, J.C., Trans. ASM 62 (1969), p. 398-409.Google Scholar
[2]Conrad, H., Scripta Metallurgica 7.5 (1973), p. 509-512.Google Scholar
[3]Namboodhiri, T.K.G., McMahon, C.J. and Herman, H., Metallurgical Transactions, 4(5) (1973), p.1323-1331.Google Scholar
[4]Fitzner, Arnas, et al. , Acta Materialia 103 (2016), p. 341-351.Google Scholar
[5]Neeraj, T., and Mills, M. J., Philosophical Magazine A 82.4 (2002), p. 779-802.Google Scholar
[6]Zhang, R., Traylor, R., Pekin, T., Ozdol, B., Ophus, C., and Minor, A. M. (2018). Microscopy and Microanalysis, 24(S1) (2018), p. 210-211.Google Scholar
[7]Neeraj, T., and Mills, M. J., Philosophical Magazine A 82.4 (2002), p. 779-802.Google Scholar
[8]Pekin, Thomas C., et al. , Scripta Materialia 146 (2018), p. 87-90.Google Scholar
[9]Van de Walle, A., and Asta, M., Metallurgical and Materials Transactions A 33.3 (2002), p. 735-741.Google Scholar
[10]We gratefully acknowledge funding from the US Office of Naval Research under Grant No. N00014-12-1-0413. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar