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Understanding Nanoscale 4D Microstructural Evolution in Aluminum Alloys using Transmission X-Ray Microscopy (TXM)

Published online by Cambridge University Press:  04 August 2017

C. Shashank Kaira ,
V. De Andrade ,
S. S. Singh ,
C. Kantzos ,
F. De Carlo  and
Nikhilesh Chawla
C. Shashank Kaira
Affiliation:
Materials Science and Engineering, Arizona State University, Tempe, USA.
V. De Andrade
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, USA.
S. S. Singh
Affiliation:
Materials Science and Engineering, Arizona State University, Tempe, USA. Department of Materials Science and Engineering, Indian Institute of Technology Kanpur, India.
C. Kantzos
Affiliation:
Materials Science and Engineering, Arizona State University, Tempe, USA.
F. De Carlo
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, USA.
Nikhilesh Chawla
Affiliation:
Materials Science and Engineering, Arizona State University, Tempe, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2220 - 2221
Copyright
© Microscopy Society of America 2017 

References

[1] Kaira, C.S., et al Nanoscale Three-Dimensional Microstructural Characterization of an Sn-Rich Solder Alloy Using High-Resolution Transmission X-Ray Microscopy (TXM). Microscopy and Microanalysis, 1–6, 2016.Google ScholarPubMed
[2] De Andrade, V., et al Nanoscale 3D imaging at the Advanced Photon Source. SPIE Newsroom, 2016.CrossRefGoogle Scholar
[3] Gürsoy, D., De Carlo, F., Xiao, X. & Jacobsen, C TomoPy: A framework for the analysis of synchrotron tomographic data. J. Synchrotron Radiation 21, 1188–1193, 2014.CrossRefGoogle ScholarPubMed
[4] The authors are grateful for financial support from the Army Research Office (ARO) under Contract (No. W911NF1410550(Dr. David Stepp, Program Manager).Google Scholar