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Ultralow-Energy Excitations and Prospects for Spatially Resolved Spectroscopy

Published online by Cambridge University Press:  22 January 2004

A. Howie
A. Howie
Affiliation:
Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK
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Abstract

The key contribution of electron microscopy methods to condensed matter spectroscopy is undoubtedly spatial resolution. So far this has mainly been manifest through electron energy loss spectroscopy in the 1-eV to 10-keV energy range and has not seriously challenged the dominance of optical, X-ray, and neutron spectroscopy methods over most of the vast field at lower energies. At frequencies up to a few megahertz, corresponding to energies of a few nanoelectron volts and below, direct excitation by pulsed electron beams or electric fields has proved effective. Prospects are discussed for extending spatially resolved spectroscopy to the intermediate energy region, mainly by combining the advantages of electrons with those of photons.

Keywords

spatial spectroscopypulsed-beam STEMSEAMPEEMapertureless near-field microscopy
Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue 1 , February 2004 , pp. 28 - 33
Copyright
© 2004 Microscopy Society of America

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References

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