Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-19T06:17:45.336Z Has data issue: false hasContentIssue false
  • English
  • Français

A Two-Stage Gas Amplification Secondary Electron Detector for Ultra-High Resolution Imaging

Published online by Cambridge University Press:  01 August 2004

B L Thiel ,
Milos Toth ,
R P M Schroemges ,
J J Scholtz ,
Gerard van Veen  and
W R Knowles
B L Thiel
Affiliation:
State University of New York Albany
Milos Toth
Affiliation:
FEI Company, Peabody, Massachusetts
R P M Schroemges
Affiliation:
FEI Company, Peabody, Massachusetts
J J Scholtz
Affiliation:
FEI Company, Peabody, Massachusetts
Gerard van Veen
Affiliation:
FEI Company, Peabody, Massachusetts
W R Knowles
Affiliation:
FEI Company, Peabody, Massachusetts
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1058 - 1059
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)