Hostname: page-component-8448b6f56d-qsmjn Total loading time: 0 Render date: 2024-04-25T01:46:18.524Z Has data issue: false hasContentIssue false
  • English
  • Français

Two beam toy model for dislocation contrast in ECCI

Published online by Cambridge University Press:  05 August 2019

Elena Pascal ,
Ben Hourahine ,
Carol Trager-Cowan  and
Marc De Graef
Elena Pascal
Affiliation:
Dept. of Physics, SUPA, University of Strathclyde, Glasgow, G4 0NG, UK. Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA.
Ben Hourahine
Affiliation:
Dept. of Physics, SUPA, University of Strathclyde, Glasgow, G4 0NG, UK.
Carol Trager-Cowan
Affiliation:
Dept. of Physics, SUPA, University of Strathclyde, Glasgow, G4 0NG, UK.
Marc De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1968 - 1969
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Pascal, E et al. , Mat. Today: Proceedings, 5, 2018.Google Scholar
[2]Howie, A and Whelan, M J, Proc. Royal Soc. Lond. A 263.1313, 1961.Google Scholar
[3]Picard, Y N et al. , Ultramicroscopy 146, 2014.Google Scholar
[4]Tunstall, W J et al. , Phi. Mag. 9.97, 1964.Google Scholar
[5]Pascal, E, PhD Thesis, University of Strathclyde, 2019.Google Scholar
[6]EP and MDG acknowledge an ONR Vannevar Bush Faculty Fellowship (N00014-16-1-2821), and the computational resources of the Materials Characterization Facility at CMU, grant MCF-677785.Google Scholar