Hostname: page-component-848d4c4894-v5vhk Total loading time: 0 Render date: 2024-06-22T18:31:52.130Z Has data issue: false hasContentIssue false
  • English
  • Français

Transmission Electron Forward Scattered Diffraction and Low Voltage SEM/STEM Characterization of Binder-Free TiO2 Electrodes

Published online by Cambridge University Press:  27 August 2014

Micah Sussman ,
Nicolas Brodusch ,
Raynald Gauvin  and
George P. Demopoulos
Micah Sussman
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
George P. Demopoulos
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 492 - 493
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Brezesinski, T., et al, Journal of the American Chemical Society 129 (2009), pp. 1802-1809.Google Scholar
[2] Brodusch, N., Demers, H., Gauvin, R. Journal of Microscopy 250 (2013), pp. 1-14.Google Scholar
[3] Reddy, M. A., et al, Electrochemistry Communications 8 (2006). pp. 1299-1303.Google Scholar