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Transmission Electron Diffraction From Nanoparticles, Nanowires and Thin Films in an SEM With Conventional EBSD Equipment

Published online by Cambridge University Press:  01 August 2010

RH Geiss
Affiliation:
National Institute of Standards and Technology
RR Keller
Affiliation:
National Institute of Standards and Technology
DT Read
Affiliation:
National Institute of Standards and Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010