Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Tsurusawa, Hideyo
Uzuhashi, Jun
Kozuka, Yusuke
Kimoto, Koji
and
Ohkubo, Tadakatsu
2024.
Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy.
Small Methods,
Uzuhashi, Jun
Ohkubo, Tadakatsu
and
Hono, Kazuhiro
2024.
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy.
Microscopy and Microanalysis,
Uzuhashi, Jun
and
Ohkubo, Tadakatsu
2024.
Systematic study of FIB-induced damage for the high-quality TEM sample preparation.
Ultramicroscopy,
Vol. 262,
Issue. ,
p.
113980.