Toward Simultaneous Assessment of In and N in InGaAsN Alloys by Quantitative STEM-ADF Imaging

V Grillo; K Müller; F Glas; K Volz; A Rosenauer

doi:10.1017/S143192761101018X

Toward Simultaneous Assessment of In and N in InGaAsN Alloys by Quantitative STEM-ADF Imaging

Published online by Cambridge University Press: 08 April 2017

V Grillo ,

K Müller ,

F Glas ,

K Volz and

A Rosenauer

Show author details

V Grillo: Affiliation:
CNR, Italy
K Müller: Affiliation:
Universität Bremen, Germany
F Glas: Affiliation:
CNRS, France
K Volz: Affiliation:
Philipps University Marburg, Germany
A Rosenauer: Affiliation:
Universität Bremen, Germany

Article contents

Extract

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1862 - 1863

DOI: https://doi.org/10.1017/S143192761101018X [Opens in a new window]

Article contents

Toward Simultaneous Assessment of In and N in InGaAsN Alloys by Quantitative STEM-ADF Imaging

Extract

Save article to Kindle

Save article to Dropbox

Save article to Google Drive

Reply to: Submit a response

Your details

You have entered the maximum number of contributors

Conflicting interests