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Time-Resolved High-Resolution Transmission Electron Microscopy Using a Piezo-Driving Specimen Holder for Atomic-Scale Mechanical Interaction

Published online by Cambridge University Press:  28 July 2005

Tokushi Kizuka ,
Nobuo Tanaka ,
Shunji Deguchi  and
Mikio Naruse
Tokushi Kizuka
Affiliation:
Department of Applied Physics, School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan Research Center for Advanced Waste and Emission Management, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
Nobuo Tanaka
Affiliation:
Department of Applied Physics, School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
Shunji Deguchi
Affiliation:
JEOL Ltd., Akishima, Tokyo 196-8558, Japan
Mikio Naruse
Affiliation:
JEOL Ltd., Akishima, Tokyo 196-8558, Japan
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Abstract

Time-resolved high-resolution transmission electron microscopy at a spatial resolution of 0.2 nm and a time resolution of 1/60 sec using a piezo-driving specimen holder is reported here. Various types of atomic processes in mechanical interaction, such as contact, bonding, deformation, and fracture, in nanometer-sized gold crystallites and carbon nanotubes are demonstrated.

Keywords

mechanicshigh-resolution transmission electron microscopyTV-rate systempiezo-drivingscanning probe microscopygold
Type
1998 ASU ELECTRON MICROSCOPY WORKSHOP
Information
Microscopy and Microanalysis , Volume 4 , Issue 3 , June 1998 , pp. 218 - 225
Copyright
© 2005 Microscopy Society of America

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