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Thickness-Dependent Defect Evolution in GaAs0.92Sb0.08/GaAs Heterostructures

Published online by Cambridge University Press:  04 August 2017

Abhinandan Gangopadhyay ,
Aymeric Maros ,
Nikolai Faleev  and
David J. Smith
Abhinandan Gangopadhyay
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ
Aymeric Maros
Affiliation:
School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ
Nikolai Faleev
Affiliation:
School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1482 - 1483
Copyright
© Microscopy Society of America 2017 

References

[1] Luque, A. & Martí, A. Phys. Rev. Lett 78 1997). p. 5014.Google Scholar
[2] Chang, K. H., Bhattacharya, P. K. & Gibala, R. J. Appl. Phys 66 1989). p. 2993.CrossRefGoogle Scholar
[3] Maros, A., et al, J. Appl. Phys. 120 2016). p. 183104.Google Scholar
[4] This work was supported by the National Science Foundation and the Department of Energy under NSF CA No. EEC-1041895. The authors acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.Google Scholar