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Theoretical Evaluation of Atomic-Resolution X-ray Analysis toward Quantification

Published online by Cambridge University Press:  23 September 2015

M. Watanabe*
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA 18015.

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Watanabe, M., Microscopy 62 (2013) 217241.CrossRefGoogle ScholarPubMed
[2] Kothleitner, G., et al., Phys. Rev. Lett. 112 (2014) 085501.CrossRefGoogle Scholar
[3] Ishizuka., K., J. Electron Microsc. 50 (2012) 291.CrossRefGoogle Scholar
[4] Fiori, C.E., et al., Public domain DTSA software package (1992).Google Scholar
[5] The author wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229.Google Scholar