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TEM Investigations of Ion-Irradiated Cerium Oxide Thin Film

Published online by Cambridge University Press:  05 August 2019

Sergei Rouvimov  and
Khachatur V. Manukyan
Sergei Rouvimov
Affiliation:
Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN, USA.
Khachatur V. Manukyan
Affiliation:
Department of Physics, University of Notre Dame, Notre Dame, IN, USA.

Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1620 - 1621
Copyright
Copyright © Microscopy Society of America 2019 

References

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