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TEM Investigation of Interfacial Reactions Between SrFeO2.5+x Thin Films and Silicon, Sapphire Substrates

Published online by Cambridge University Press:  01 August 2004

Dashan Wang ,
Xiaomei Du ,
James J. Tunney ,
Michael L. Post  and
Raynald Gauvin
Dashan Wang
Affiliation:
National Research Council of Canada, Ottawa, Canada
Xiaomei Du
Affiliation:
National Research Council of Canada, Ottawa, Canada
James J. Tunney
Affiliation:
National Research Council of Canada, Ottawa, Canada
Michael L. Post
Affiliation:
National Research Council of Canada, Ottawa, Canada
Raynald Gauvin
Affiliation:
McGill University, Montreal, Canada
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 572 - 573
Copyright
© 2004 Microscopy Society of America

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