Hostname: page-component-77c89778f8-vpsfw Total loading time: 0 Render date: 2024-07-18T15:26:19.751Z Has data issue: false hasContentIssue false

TEM Investigation of Er2O3 Thin Films Grown on Si (100) by Laser MBE

Published online by Cambridge University Press:  01 August 2010

YL Zhu
Affiliation:
Shenyang National Laboratory for Materials Science, China
X Wang
Affiliation:
Shenyang National Laboratory for Materials Science, China
M He
Affiliation:
Beijing National Laboratory for Condensed Matter Physics, China
HB Lu
Affiliation:
Beijing National Laboratory for Condensed Matter Physics, China
XL Ma
Affiliation:
Beijing National Laboratory for Condensed Matter Physics, China

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010