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TEM Characterization of Phase Separation and Transformation at the Thin Film Interfaces in the SrFeO2.5+x/SiO2/Si System

Published online by Cambridge University Press:  01 August 2005

D Wang ,
X Du ,
J J Tunney ,
M L Post  and
R Gauvin
D Wang
Affiliation:
National Research Council,Canada
X Du
Affiliation:
National Research Council,Canada
J J Tunney
Affiliation:
National Research Council,Canada
M L Post
Affiliation:
National Research Council,Canada
R Gauvin
Affiliation:
McGill University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1962 - 1963
Copyright
© 2005 Microscopy Society of America