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TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination

Published online by Cambridge University Press:  23 September 2015

Jian-Min Zuo ,
Yifei Meng ,
Piyush Vivek Deshpande ,
Yang Hu ,
Kyou-Hyun Kim ,
Hui Xing ,
Peng Zhang  and
Haifeng Wang
Jian-Min Zuo
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Yifei Meng
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Piyush Vivek Deshpande
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Yang Hu
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Kyou-Hyun Kim
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013
Hui Xing
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 618013 School of Materials Science and Engineering, Shanghai Jiaotong University, China
Peng Zhang
Affiliation:
Western Digital Technologies, Inc., 44200 Osgood Road, Fremont CA, 94539
Haifeng Wang
Affiliation:
Western Digital Technologies, Inc., 44200 Osgood Road, Fremont CA, 94539

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1095 - 1096
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[10] The work reported here is supported by DOE BES under contract DEFG02-01ER45923 and a grant from Western Digital..Google Scholar