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TEM Analysis of Deformation Zones in FIB-Prepared Samples of Microploughed Gold (100) and (111) Surfaces

Published online by Cambridge University Press:  02 July 2020

R. D. Day ,
R. M. Dickerson ,
C. J. Maggiore ,
P. M. Brooks ,
P. E. Russell ,
T. Woodward  and
C. B. Carter
R. D. Day
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545
R. M. Dickerson
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545
C. J. Maggiore
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545
P. M. Brooks
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545
P. E. Russell
Affiliation:
North Carolina State University, Raleigh, NC, 27606
T. Woodward
Affiliation:
Materials Analytical Services, Raleigh, NC, 27606
C. B. Carter
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM, 87545
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Extract

To improve the understanding of the mechanical deformation mechanisms associated with friction, wear, and precision machining processes, a detailed set of microploughing experiments were performed on gold single crystal surfaces. Large single crystals that had an edge length of 1.5 mm and a thickness of 1 mm were used for this work. Since the microplough depths ranged from 100 nm to 1600 nm, it was important that the material be damage free at the surface. This condition was verified by alpha particle backscattering. A stand-alone STM head, having a singlecrystal diamond tip, was used in conjunction with a Digital Instruments Nanoscope Ilia controller to generate the 13 μm long microploughs. The vertical ploughing force was measured using a Mettler AE130 semi-microbalance.

After generating the microploughs and measuring their geometry with an AFM, some of the microploughs were cross sectioned for TEM observation.

Type
Scanned Probe Microscopy: Much More Than Just Beautiful Images
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 326 - 327
Copyright
Copyright © Microscopy Society of America

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