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Surface imaging with UHV SLEEM and SEM LEEM

Published online by Cambridge University Press:  05 August 2019

Šárka Mikmeková ,
Pavel Jánský ,
Vladimír Kolařík  and
Ilona Müllerová
Šárka Mikmeková*
Affiliation:
ISI Brno, Czech Academy of Sciences, Brno, Czech Republic
Pavel Jánský
Affiliation:
Delong Instruments a.s., Brno, Czech Republic
Vladimír Kolařík
Affiliation:
Delong Instruments a.s., Brno, Czech Republic
Ilona Müllerová
Affiliation:
ISI Brno, Czech Academy of Sciences, Brno, Czech Republic
*
*Corresponding author: sarka@isibrno.cz

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 444 - 445
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Bauer, E. “Low Energy Electron Microscopy” (Springer Verlag, New York), 2014.Google Scholar
[2]Mullerova, I et al. Adv. Imag. Electron Phys. 128 (2003), p. 309-443.Google Scholar
[3]www.isibrno.czGoogle Scholar
[4]www.delong.czGoogle Scholar
[5]The authors acknowledge funding from the Technology Agency of the Czech Republic (Competence center: Electron microscopy, no: TE01020118).Google Scholar