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Studying CdTe Grain Boundaries by (Aberration Corrected) STEM-Cathodoluminescence and Electron Beam Induced Current

Published online by Cambridge University Press:  23 November 2012

A. Mouti ,
C. Li  and
S.J. Pennycook
A. Mouti
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
C. Li
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
S.J. Pennycook
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1332 - 1333
Copyright
Copyright © Microscopy Society of America 2012

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