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Study for Automated Imaging with Phase Plate Electron Microscopy and Suggestions for the Future Instrumentation

Published online by Cambridge University Press:  23 November 2012

H. Qian ,
H. Furukawa ,
M. Shimizu ,
M. Kawasaki  and
M. Shiojiri
H. Qian
Affiliation:
National Institute for Nanotechnology, Edmonton, Alberta, Canada
H. Furukawa
Affiliation:
SYSTEM IN FRONTIER INC., Tokyo, Japan
M. Shimizu
Affiliation:
SYSTEM IN FRONTIER INC., Tokyo, Japan
M. Kawasaki
Affiliation:
JEOLUSA Inc., Peabody, MA
M. Shiojiri
Affiliation:
Kyoto Institute of Technology, Kyoto, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 500 - 501
Copyright
Copyright © Microscopy Society of America 2012

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