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The Structure of Charge Density Wave Phase Transitions in Atomically Thin Materials

Published online by Cambridge University Press:  30 July 2020

Robert Hovden
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Suk Hyun Sung
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Noah Schnitzer
Affiliation:
Cornell University, Ithaca, New York, United States
Steve Novakov
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Ismail El Baggari
Affiliation:
Cornell University, Ithaca, New York, United States
Benjamin Savitzky
Affiliation:
National Center for Electron Microscopy (NCEM), Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, United States
John Heron
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Lena Kourkoutis
Affiliation:
Cornell University, Ithaca, New York, United States
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Abstract

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Type
Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Copyright
Copyright © Microscopy Society of America 2020

References

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Hovden, R., Tsen, A. W., Savitzky, B. H., Liu, P., El Baggari, I., Liu, Y., Lu, W.J., Sun, Y., Kim, P., Pasupathy, A. N., Kourkoutis, L. F. Proc. Natl. Acad. Sci. U.S.A. 113, 11420 (2016)10.1073/pnas.1606044113CrossRefGoogle Scholar
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This work was supported by the Keck FoundationGoogle Scholar
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