The quality of the Kikuchi patterns obtained for example by electron backscattered diffraction decreases when the dislocation density increases in strained materials, and consequently, it can theoretically be correlated to the strain through the average dislocation density measurement particularly for monotonic deformation paths. For that purpose, in a first step it is necessary to define a quality factor defined in the Hough space or with the Burns method currently used when the Kikuchi patterns are automatically analyzed. Then, and it is the most important point, the quality factor must be linked to the strain through a calibration curve independent of crystallographic orientation.

The main objective of this study is to test the reliability of this method in the simple case of the hardness test. This test is simulated using the finite element method and the obtained results are compared to those measured by electron backscattered diffraction. Several calibration methods are defined.