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STEM-in-SEM highly deformed structure investigation with focus on electron-transparent specimen preparation

Published online by Cambridge University Press:  30 July 2021

Pawel Nowakowski
Affiliation:
E.A. Fischione Instruments, Inc., United States
Cecile Bonifacio
Affiliation:
E.A. Fischione Instruments, Inc., United States
Jörg Wiezorek
Affiliation:
University of Pittsburgh, United States
Mary Ray
Affiliation:
E.A. Fischione Instruments, Inc., United States
Paul Fischione
Affiliation:
E.A. Fischione Instruments, Inc., United States

Abstract

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Type
Advances in Analytical STEM-in-SEM
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Tripathi, A., & Zaefferer, S. (2019). On the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesium. Ultramicroscopy, 207, 112828.CrossRefGoogle ScholarPubMed
Keller, R., & Geiss, R. (2011). Transmission EBSD from 10 nm domains in a scanning electron microscope. Journal of Microscopy, 245(3), 245-251.CrossRefGoogle Scholar
Trimby, P. W. (2012). Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope. Ultramicroscopy, 120, 16-24.CrossRefGoogle ScholarPubMed
Liu, J., Lozano-Perez, S., Wilkinson, A. J., & Grovenor, C. R. (2019). On the depth resolution of transmission Kikuchi diffraction (TKD) analysis. Ultramicroscopy, 205, 5-12.CrossRefGoogle ScholarPubMed
Brodu, E., Bouzy, E., Fundenberger, J., Guyon, J., Guitton, A., & Zhang, Y. (2017). On-axis TKD for orientation mapping of nanocrystalline materials in SEM. Materials Characterization, 130, 92-96.CrossRefGoogle Scholar
Van Bremen, R., Ribas Gomes, D., De Jeer, L., Ocelík, V., & De Hosson, J. (2016). On the optimum resolution of transmission-electron backscattered diffraction (t-EBSD). Ultramicroscopy, 160, 256-264.CrossRefGoogle Scholar
Nowakowski, P., Wiezorek, J., Bathula, V., Mielo, S., Khanal, S., Bonifacio, C., & Fischione, P. (2018). SEM and TEM characterization of plastic deformation structures in aluminum by EBSD, TKD, and PED-based orientation imaging techniques. Microscopy and Microanalysis, 24(S1), 2182-2183.Google Scholar
Fundenberger, J., Bouzy, E., Goran, D., Guyon, J., Yuan, H., & Morawiec, A. (2016). Orientation mapping by transmission-SEM with an on-axis detector. Ultramicroscopy, 161, 17-22.CrossRefGoogle ScholarPubMed
Kato, N. I. (2004). Reducing focused ion beam damage to transmission electron microscopy samples. Journal of Electron Microscopy, 53(5), 451-458.Google ScholarPubMed
Mayer, J., Giannuzzi, L. A., Kamino, T., & Michael, J. (2007). TEM sample preparation and FIB-induced damage. MRS Bulletin, 32(5), 400-407.Google Scholar