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STEM Electron Tomography for Nanoscale Materials Science

Published online by Cambridge University Press:  01 August 2004

Paul Anthony Midgley ,
Matthew Weyland ,
Tim Yates ,
Jenna Tong ,
Rafal E Dunin-Borkowski  and
John Meurig Thomas
Paul Anthony Midgley
Affiliation:
University of Cambridge, Cambridge, United Kingdom
Matthew Weyland
Affiliation:
University of Cambridge, Cambridge, United Kingdom
Tim Yates
Affiliation:
University of Cambridge, Cambridge, United Kingdom
Jenna Tong
Affiliation:
University of Cambridge, Cambridge, United Kingdom
Rafal E Dunin-Borkowski
Affiliation:
University of Cambridge, Cambridge, United Kingdom
John Meurig Thomas
Affiliation:
University of Cambridge, Cambridge, United Kingdom Davy-Faraday Laboratories, London, United Kingdom
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 148 - 149
Copyright
© 2004 Microscopy Society of America

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