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(S)TEM Dual Axis Tomography

Published online by Cambridge University Press:  03 August 2008

A Voigt ,
A Yakushevska ,
F de Haas ,
W Voorhout  and
R Schoenmakers
A Voigt
Affiliation:
FEI, The Netherlands
A Yakushevska
Affiliation:
FEI, The Netherlands
F de Haas
Affiliation:
FEI, The Netherlands
W Voorhout
Affiliation:
FEI, The Netherlands
R Schoenmakers
Affiliation:
FEI, The Netherlands
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1046 - 1047
Copyright
© 2008 Microscopy Society of America

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