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Specially Designed Sample Holder and In-situ TEM for Gas-Solid Interaction Studies at an Atomic Resolution

Published online by Cambridge University Press:  03 August 2008

XF Zhang
XF Zhang
Affiliation:
Hitachi High Technologies America
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 790 - 791
Copyright
© 2008 Microscopy Society of America

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